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Jinghong Guo, Stephen H. Edwards, and Dushan Borojevic. Implementing dataflow-based control software for power electronics. In Proceedings of the IEEE 9th Workshop on Computers in Power Electronics (COMPEL), 2002. |
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Stephen H. Edwards, editor. Proceedings of the RESOLVE Workshop 2002. Technical Report TR-02-11, Dept. of Computer Science, Virginia Tech, Blacksburg, VA, June 2002. |
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Jinghong Guo, Stephen H. Edwards, and Dushan Borojevic. Elementary control objects: Toward a dataflow architecture for power electronics control software IEEE. In Proceedings of the IEEE 33rd Annual Power Electronics Specialists Conference, PESC’02, 2002, pp. 1705–1710. |
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Stephen H. Edwards. Software Reuse: A Standards-Based Guide, book review in ACM Computing Reviews, May 2002. |
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Sumithra Bhakthavatsalam and Stephen H. Edwards. Applying object-oriented techniques in embedded software design. In Proceedings of the CPES 2002 Power Electronics Seminar and NSF/Industry Annual Review, April, 2002. |
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Jerry Francis, Jinghong Guo, and Stephen H. Edwards. Protocol design of dual ring PESNet (DRPESNet). In Proceedings of the CPES 2002 Power Electronics Seminar and NSF/Industry Annual Review, April, 2002. |
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Jinghong Guo, Stephen Edwards, and Dushan Boroyevich. Designing reusable, reconfigurable control software for power electronics systems. In Proceedings of the CPES 2002 Power Electronics Seminar and NSF/Industry Annual Review, April, 2002. |
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Kuljeet Singh and Stephen H. Edwards. DARK: Designing a high performance micro-kernel for power electronics controllers. In Proceedings of the CPES 2002 Power Electronics Seminar and NSF/Industry Annual Review, April, 2002. |
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Stephen H. Edwards. Toward reflective metadata wrappers for formally specified software components. In Proceedings of the Workshop on Specification and Verification of Component Based Systems, held in conjunction with OOPSLA 2001, October, 2001. |
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Stephen H. Edwards. A framework for practical, automated black-box testing of component-based software. Software Testing, Verification and Reliability, 11(2):97-111, June, 2001. |
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